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Uniform theory of diffraction

In the world of Uniform theory of diffraction, there has always been a constant and ever-evolving interest. Whether we are talking about a historical figure, a cultural phenomenon or a scientific topic, Uniform theory of diffraction has left its mark on humanity in one way or another. Its influence has spread over time and continues to impact today. In this article, we will closely explore the importance of Uniform theory of diffraction and how it has shaped our society, as well as the implications it has for the future. From its beginnings to the present, Uniform theory of diffraction has generated countless discussions, debates and studies that seek to understand its scope and meaning in people's lives.

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In numerical analysis, the uniform theory of diffraction (UTD) is a high-frequency method for solving electromagnetic scattering problems from electrically small discontinuities or discontinuities in more than one dimension at the same point.[1] UTD is an extension of Joseph Keller's geometrical theory of diffraction (GTD)[2] and was introduced by Robert Kouyoumjian and Prabhakar Pathak in 1974.[1][3]

The uniform theory of diffraction approximates near field electromagnetic fields as quasi optical and uses knife-edge diffraction to determine diffraction coefficients for each diffracting object-source combination. These coefficients are then used to calculate the field strength and phase for each direction away from the diffracting point. These fields are then added to the incident fields and reflected fields to obtain a total solution.

See also

References

  1. ^ a b R. G. Kouyoumjian and P. H. Pathak, "A uniform geometrical theory of diffraction for an edge in a perfectly conducting surface," Proc. IEEE, vol. 62, pp. 1448–1461, November 1974.
  2. ^ J. B. Keller, "Geometrical theory of diffraction", J. Opt. Soc. Am., vol. 52, no. 2, pp. 116–130, 1962.
  3. ^ Pathak, P. H. (2003). Brief summary of research in high frequency methods at OSU-ESL. Antennas and Propagation Society International Symposium. doi:10.1109/APS.2003.1220345.